OPEN-JTAG ARM JTAG Test Principle 1 Introduction This report introduces the ARM JTAG test the basic principles. Basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction On this basis, the combination of ARM7TDMI detailed introduction of the JTAG test principle. 2 IEEE Standard 1149.1- Test Access Port and Boundary-Scan Architecture from the IEEE standard JTAG test began, JTAG is the JOINT TEST ACTION GROUP abbreviation. IEEE 1149.1 standard was originally proposed by JTAG this organization, and ultimately approved by the IEEE and standardization, therefore, IEEE 1149.1 standard generally known as the JTAG test standard. Introduce the next TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE basic structure.

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JTAGrep.doc

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