Introduction - If you have any usage issues, please Google them yourself
Abstract—This paper presents a highly effective compactor architecture for processing test responses with a high percentage of x-values. The key component is a hierarchical configurable
masking register, which allows the compactor to dynamically adapt to and provide excellent performance over a wide range
of x-densities. A major contribution of this paper is a technique
that enables the efficient loading of the x-masking data into
the masking logic in a parallel fashion using the scan chains.
A method for eliminating the requirement for dedicated mask control signals using automated test equipment timing flexibility is also presented. The proposed compactor is especially suited to multisite te